Faculty Name: Prof. Ranjith Ramadurai

Course Name: Advanced X-Ray Analysis of Materials and Devices

Course Period: 02 ^nd Jan to 24 ^th Mar 2025 (Monday 11:00 AM to 11:55 AM; Wednesday 10:00 AM to 10:55 AM; Thursday 09:00 AM to 09:55 AM)

Number of Credits: 3 credit

Course Contents: The course will focus on imparting in-depth knowledge and critical understanding of essential concepts in X-ray interaction with materials and utilizing the same to characterize materials. The course will deal with basics of crystallography and various modes of X-ray analysis of the same. The course will also have some demonstrations on structural solving and structural refinement.

What you'll learn: The course will help students develop an up-to-date understanding on X-ray scattering of materials, crystallography, structural refinement, estimation of strain, thin films, mosaicity, epitaxy.